ETSP-BTC series are Semiconductor Monitoring Burn-In test chambers to stress semiconductor packaged devices to ensure optimum performance as well as to weed out defective semiconductor packaged devices which can cause reliability problems in the end product.
- Uniform high accurate and reliable temperature control
- Easy of operation and simplicity
- Friendly, flexible, up-to date control and management systems
- Allows easy servicing and upgrades
- Selectable between manual door type (BTC 1000) and automatic door type (BTC 2000)
- Computer control is available
- Network connection of several chambers to a single "master" control unit allowing centralized supervision both in local and remote mode
| Temperature range | 40 ℃ ~ 150 ℃ (changeable according to user's demand) |
|---|---|
| Temperature uniformity | Less than ± 0.5 ℃ |
| Temperature rising time | RT to 125 ℃ less than 50 minutes |
| Temperature cooling time | 125 ℃ to RT less than 50 minutes |
| Cool own rate | More than 1~5 ℃/min |
| Input power requirements | 230V ±10%, 380V ±10%, 50Hz/60Hz, 1Ph/3Ph |
| Model | Internal dimensions | External dimensions | Note |
|---|---|---|---|
| ETSP-BTC 1000 | 1250x650x1300 (WxDxH) mm | 2250x1500x2500 (WxDxH) mm | Manual door |
| ETSP-BTC 2000 | 1250x1500x2500 (WxDxH) mm | 1250x650x1300 (WxDxH) mm | Automatic door |
